The gateway to Europe's
integrated metrology community.

Gael Obein

Positions and Memberships

Institutional contact
DI Contact
Technical Committees Observer
Photometry and Radiometry
EMN Section Member - Expert
Advanced Materials (EMN Advanced Manufacturing)
Coordinator Projecttype
Key comparison on spectral regular transmittance 2018 Technical Committee
Key comparison on spectral regular transmittance Technical Committee
Multidimensional reflectometry for industry EMRP
Bidirectional reflectance definitions EMPIR
New quantities for the measurement of appearance EMPIR
Multidimensional optical diffusion for the measurement of appearance Metrology Partnership

Contact