The 2013 MRS (Materials Research Society) Fall Meeting and Exhibit will provide a unique opportunity to bring together participants from all sectors of the global materials and engineering communities. The following EMRP projects will be presented at the meeting:
- Traceable characterisation of nanostructured devices (NEW01 TReND) will support the semiconductor industry by developing and improving the methods for characterising the chemical and electrical properties of nanostructures, and make comparisons between the different techniques.
- Metrology for the manufacturing of thin films (IND07 Thin Films) will improve the nanoscale measurements needed to develop thin film technologies, improving our understanding of film properties and reducing material and energy costs.
