EMRP project (ENG53 ThinErgy) Traceable characterisation of thin-film materials for energy applications will develop the measurements needed to characterise the structure of thin films and their novel properties. Models will also be developed to help interpret the measurements and relate them to product performance.
Results from the project will be presented at the symposium. The symposium will cover recent and innovative developments in analytical techniques that can provide precise characterization of materials and devices with nanoscale and/or atomic resolution. The objective of this symposium is both to highlight the capabilities of precise techniques for the determination of the key structural and material parameters and for a better understanding of the functional properties of challenging new materials.