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CIM 2017 - 18th International Metrology Congress

Measure to create the future

The 18th International Metrology Congress will take place on 19 - 21 September 2017 in Paris, France.

CIM is a unique crossroads between R&D and industrial applications for all actors and all fields: industrial end-users of measurement equipments, technical experts, public and private laboratories, manufacturers and service providers.

The Congress allows to:

  • improve your measurement, analysis and test processes, whilst reducing any inherent risks,
  • explore evolutions in techniques, R&D progress and learn more about practical industrial applications.

Major topics in 2017 include: metrology 4.0 and factory of the future, new ISO 17 025, metrology for biology, health and pharmaceutics, new developments in energy, nanotechnologies and others.

For further information and registration, please go to the CIM website.

Event Information

Date
2017-09-19 to 2017-09-21
Location
Paris, France
Categories
EMRP , External , EMPIR