The European Materials Research Society (EMRS) Spring Meeting attracts over 2,500 scientists and engineers each year with a combination of technical and plenary sections and a large industrial exhibition. This conference will include 30 parallel symposia, one of which is entitled ALTECH 2014 - Analytical techniques for precise characterization of nanomaterials.
ALTECH 2014 is expected to attract over 100 contributions and a stakeholder workshop with technical contributions and tutorials from the following EMRP projects:
- Traceable characterisation of nanostructured devices (NEW01 TReND) will support the semiconductor industry by developing and improving the methods for characterising the chemical and electrical properties of nanostructures, and make comparisons between the different techniques.
- Traceable measurement of mechanical properties of nano-objects (NEW05 MechProNO) will develop measurement traceability for the mechanical properties of nano-objects such as nanoparticles, nanowires and composite materials through the development of test samples, new techniques and improved instruments.
- Metrology for the manufacturing of thin films (IND07 Thin Films) will improve the nanoscale measurements needed to develop thin film technologies, improving our understanding of film properties and reducing material and energy costs
- Novel electronic devices based on control of strain at the nanoscale (IND54 Nanostrain) will produce traceable measurements of strains down to the nanometre to help develop computing devices based on piezoelectrics.
- Chemical metrology tools for manufacture of advanced biomaterials in the medical device industry (IND56 Q-AIMDS) will develop chemical measurements to improve device quality and patient safety.
- Quantum resistance metrology based on graphene (SIB51 GraphOhm) will build stable graphene devices that can operate in relaxed conditions for use as quantum resistance standards for the electricity community.
