EMRP project Traceability of sub-nm length measurements (SIB08 subnano) will improve the traceability of high accuracy measurement devices used in National Metrology Institutes, nanomedicine, high-tech industries such as the semiconductor and nanopositioning industries, and the space industry, where calibrations need to be valid for the lifetime of the instrument.
SIB08 JRP-Partners will be presenting work of the JRP at the conference. The conference will span research, development and applications in the field of instrumentation and measurement science and technology. This includes Industrial Tracks, where research merges with practical applications in industrial technology used every day. The Conference fosters the exchange of know-how between industry and academia. Paper contests will include a Conference Best Paper Award and Student Best Poster Awards. In addition to papers, the conference will also have Tutorials and Exhibits covering the entire range of Instrumentation and Measurement Technology.
