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International Microwave Conference (IMS) 2017

EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal) will enable the traceable measurement and characterisation of integrated circuits and components from radio-frequency to sub-mm frequencies with known measurement uncertainties.

The IEEE MTT International Microwave Symposium (IMS) is the premier annual international meeting for technologists involved in all aspects of microwave theory and practice. It consists of a full week of events, including technical paper presentations, workshops, and tutorials, as well as numerous social events and networking opportunities. The symposium organisers have accepted a proposal by the consortium for a full-day workshop on 'new developments in microwave measurements for planar circuits and components'. This will take place on the 5 June 2017. In addition to this there will be a number of additional presentations by the consortium.

Event Information

Date
2017-06-04 to 2017-06-09
Location
Honolulu, Hawaii, USA
Categories
EMPIR