EMRP project Metrology with/for NEMS (NEW08 MetNEMS) will develop better measurements of physical parameters such as mass, force, displacement and temperature, as well as single photons and molecules, at the nanoscale level to support the exploitation of NEMS devices.
NEW08 JRP-Partners will present results of the JRP at the Kryo 13 conference. The conference is organized by the "Institut für Mikro- und Nanoelektronische Systeme" of the Karlsruhe Institute of Technology (KIT). Scientist and engineers of universities, research centers and companies will present and discuss current research results and applications of cryo-electronics. New developments and trends will be presented and discussed.
