EMRP project: Metrology for Raman spectroscopy (NEW02 Raman) aims to address the regulatory needs of Raman spectroscopy, by improving measurement reliability, establishing traceability to the SI units mole and metre, and developing reference samples. It will also provide measurement standards for spatial resolution, depth resolution and confocality; a specific request from device manufacturers.
NEW02 JRP-Partners will present results of the JRP at the MS&T’13 conference. The conference focuses on 11 theme areas covering the breadth of materials science and engineering. A symposium entitled 'Scanning Probe Techniques for Functional Materials' is included in the 'Fundamentals and Characterization' theme area. This symposium will focus on recent progress in material science with scanning probe techniques that include confocal Raman, FTIR, SHG and fluorescence spectroscopy on one side, conductive AFM, piezoresponse force microscopy and Kelvin probe on the other side and novel approaches such as near-field techniques that combine the merits of both domains. This symposium is targeting material scientist that need to investigate the local properties of material systems such as thin films, nano-particles, ceramics or local variations in bulk materials including strain gradients or fracture mechanics.
