After a 4-year break due to the pandemic, all those interested in (dimensional) nano- and micrometrology are invited to NanoScale 2023 in Helsinki (Finland).
The conference will take place on 10 to 12 October 2023 and focus will be on Scanning Probe Microscopy (SPM, especially AFM), optical surface measurement techniques (such as CLSM, CSI, FV, etc.) and electron microscopy techniques (SEM, TEM, TSEM). Supported by the Helmholtz Fund, the conference - organised by PTB together with the colleagues of VTT-Mikes and EURAMET TC Length - will take place at the conference centre Technopolis Ruoholahti not far from Helsinki centre, located directly at the shore of the Baltic Sea.
Scope
Creating a bridge between (industrial) researchers and metrologists
Metrology for nanotechnology and advanced manufacturing
Fast & reliable measurements for better control on the nanoscale and for more nano-safety, supporting standardization & regulation
Better understanding of optical surface measurement techniques
Reliability of nano-measurements: uncertainty assessment and standardization
Topics
Instrumentation and methods
Calibration & correction methods
Applications
Special Sessions
High-speed SPM measurements of functional properties of nanostructures
3D roughness & dimensional measurements by optical 3D microscopy
Time schedule
Mid-August 2023 - Early-bird registration deadline
April to June 2023 - Submission of abstracts (about 2 pages) via web interface
July 2023 - Review of abstracts by Scientific Committee
August 2023 - Notification of acceptance as poster or oral presentation
Further information, abstract submission and registration on www.nanoscale.de
The conference will be held In conjunction with the EURAMET TC Length and CCL WGs annual meetings.
Download flyer NanoScale 2023 >>
