An error of less than one nanometre (one billionth of a metre) may seem small enough to be inconsequential, but some applications in metrology and industry require uncertainties to this level. EMRP project ‘Traceability of sub-nm length measurements’ (SIB08 subnano), will improve the traceability of high accuracy devices such as optical interferometers and capacitive sensors, which are used to make these measurements.
SIB08 JRP-Partners will present the results of the JRP at SPIE Optical Metrology 2013; SPIE is the international society for optics and photonics. SPIE Optical Metrology is the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest inventions and applications in the field of optical metrology.
