Thin film materials possess novel properties not found in bulk materials that enable their use in flexible LCDs and solar panels. EMRP project ‘Metrology for the manufacturing of thin films’ (IND07 Thin Films) will improve the nanoscale measurements needed to develop thin film technologies, improving our understanding of film properties and reducing material and energy costs.
The JRP workshop on Traceable Optical Thin Film Characterisation is hosted by JRP-Partner BAM and is open to scientist and industry representatives working in the field of thin film characterisation by optical methods. It will cover the following topics; ellipsometric characterisation of organic and inorganic non-ideal thin films; traceable characterisation of thin films by combination of optical and X-ray methods; new trends in optical thin film measurement and design; optical analysis of thin film components for electronics and photovoltaics.
