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Comparison of coherence scanning interferometry, focus variation and confocal microscopy for surface topography measurement

Keywords:

Coherence scanning interferometry, confocal microscopy, focus variation, surface topography

Document type Proceedings
Journal title / Source euspen’s 23rd International Conference & Exhibition
Volume euspenR
Issue -
Page numbers / Article number 1 - 2
Publisher's name Euspen
Publisher's address (city only) https://www.euspen.eu/knowledge-base/ICE23191.pdf
Publication date 2023-6-12
Conference name euspen’s 23rd International Conference & Exhibition
Conference date 12-06-2023 to 16-06-2023
Conference place Copenhagen, Denmark
Web URL https://www.euspen.eu/knowledge-base/ICE23170.pdf
Language English
Persistent Identifier https://www.euspen.eu/knowledge-base/ICE23170.pdf

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