A new Conducted Immunity Test Device for Inter-Laboratory Comparisons
Tas Emrah, Pythoud FrédéricElectromagnetic Compatibility (EMC), IEC 61000-4-6, round robin, immunity, common mode, conducted, current clamp, Radio Frequency (RF) meter, Coupling-Decoupling Network (CDN), inter-laboratory comparison, Equipment under Test (EUT).
Document type | Proceedings |
Journal title / Source | IEEE International Symposium on Electromagnetic Compatibility and EMC Europe Proceedings |
Peer-reviewed article | 1 |
Volume | 1 |
Issue | 1 |
Page numbers / Article number | 855-860 |
Publisher's name | IEEE |
Publisher's address (city only) | Piscataway, USA |
Publication date | 2015-8-22 |
Conference name | IEEE International Symposium on Electromagnetic Compatibility and EMC Europe |
Conference date | 16-08-2015 to 22-08-2015 |
Conference place | Dresden / Germany |
ISSN | 2158-110X |
ISBN | 978-1-4799-6615-8 |
Web URL | http://conference.vde.com/emc2015/Pages/default.aspx |
Language | English |