Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults
Aguirre F.L., Pazos S.M., Palumbo F., Morell A., Suñé J., Miranda E.stuck-at fault; RRAM; pattern recognition; memristor; QMM; neural network; neuromorphics
| Document type | Article |
| Journal title / Source | Electronics |
| Volume | 10 |
| Issue | 19 |
| Page numbers / Article number | 2427 |
| Publisher's name | MDPI AG |
| Publication date | 2021-10 |
| ISSN | 2079-9292 |
| DOI | 10.3390/electronics10192427 |
| Web URL | https://www.mdpi.com/2079-9292/10/19/2427 |
| Language | English |