Analytical modeling and three-dimensional finite element simulation of line edge roughness in scatterometry
Kato A., Burger S., Scholze F.Document type | Article |
Journal title / Source | APPLIED OPTICS |
Volume | 51 |
Issue | 27 |
Page numbers / Article number | 6457 - 6464 |
Publication date | 2012-9-11 |
DOI | 10.1364/AO.51.006457 |
Language | English |