Development and Evaluation of an Improved Apparatus for Measuring the Emissivity at High Temperatures
Arduini M., Manara J., Stark T., Ebert H-P., Hartmann J.emissivity, reflectivity, infrared radiation, high temperature, FTIR-spectrometer, blackbody,uncertainty, X-point, inductive heating, direct radiative method
Document type | Article |
Journal title / Source | Sensors |
Volume | 21 |
Issue | 18 |
Page numbers / Article number | 6252 |
Publisher's name | MDPI AG |
Publication date | 2021-9-17 |
ISSN | 1424-8220 |
DOI | 10.3390/s21186252 |
Language | English |