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Kelvin Probe Force Microscopy under Variable Illumination: A Novel Technique To Unveil Charge Carrier Dynamics in GaN

Borowik Ł., Sochacki T., Rochat N., Charles M., González-Izquierdo P.
Keywords:

Defects, Lasers, Nitrides, Power, Surface states

Document type Datasets
Journal title / Source The Journal of Physical Chemistry C
Volume 127
Issue 26
Page numbers / Article number 12727-12734
Publisher's name American Chemical Society (ACS)
Publisher's address (city only) Washington, DC, United States
ISSN 1932-7447, 1932-7455
DOI 10.1021/acs.jpcc.3c01887
Web URL https://pubs.acs.org/doi/10.1021/acs.jpcc.3c01887?goto=supporting-info
Language English

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Name of Call / Funding Programme
EMPIR 2020: Industry