Surface layer determination for the Si spheres of the Avogadro project
Busch I., Azuma Y., Bettin H., Cibik L., Fuchs P., Fujii K., Krumrey M., Kutegens U., Kuramoto N., Mizushima S.surface layer, XPS measurements, XRF measurements.
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 48 |
| Issue | 2 |
| Publication date | 2011-3-22 |
| DOI | 10.1088/0026-1394/48/2/S10 |