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Analysis of Vector Network Analyzer Thermal Drift Error

Bystrov A., Wang Y., Gardner P.
Keywords:

measurement techniques, metrology, terahertz, vector network analyzers

Document type Article
Journal title / Source Metrology
Volume 2
Issue 2
Page numbers / Article number 150-160
Publisher's name MDPI AG
Publication date 2022-3-23
ISSN 2673-8244
DOI 10.3390/metrology2020010
Language English

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