Analysis of Vector Network Analyzer Thermal Drift Error
Bystrov A., Wang Y., Gardner P.measurement techniques, metrology, terahertz, vector network analyzers
Document type | Article |
Journal title / Source | Metrology |
Volume | 2 |
Issue | 2 |
Page numbers / Article number | 150-160 |
Publisher's name | MDPI AG |
Publication date | 2022-3-23 |
ISSN | 2673-8244 |
DOI | 10.3390/metrology2020010 |
Language | English |