Dataset for Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
Impedance, Impedance Matching, Scanning Microwave Microscopy, Gain Measurement, Noise Measurement
| Document type | Datasets |
| Journal title / Source | EEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT |
| Volume | 73 |
| Page numbers / Article number | 1-9 |
| Publisher's name | IEEE |
| Language | Abkhazian |
| Persistent Identifier | https://zenodo.org/records/13734302 |