Mid-Infrared Silicon-on-Insulator Fourier-Transform Spectrometer Chip
Nedeljkovic Milos, Velasco Aitor V., Khokhar Ali Z., Delage Andre, Cheben Pavelmid-IR, spectrometry, silicon photonics
Document type | Article |
Journal title / Source | IEEE Photonics Technology Letters |
Volume | 28 |
Issue | 4 |
Page numbers / Article number | 528-531 |
Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
Publisher's address (city only) | 445 Hoes Lane Piscataway NJ 08855-1331 United States |
Publication date | 2016-2-15 |
ISSN | 1041-1135, 1941-0174 |
DOI | 10.1109/LPT.2015.2496729 |
Web URL | http://hdl.handle.net/10261/167745 |
Language | English |