Detection efficiency calibration of single-photon silicon avalanche photodiodes traceable using double attenuator technique
López M., Hofer H., Kück S.detection efficiency, Si-SPAD, photon statistics
Document type | Article |
Journal title / Source | Journal of Modern Optics |
Peer-reviewed article | 1 |
Volume | 62 |
Issue | S2 |
Page numbers / Article number | S21-S27 |
Publisher's name | Taylor & Francis. |
Publisher's address (city only) | London |
Publication date | 2015-3-27 |
ISSN | 0950-0340 |
DOI | 10.1080/09500340.2015.1021724 |
Web URL | http://www.tandfonline.com/loi/tmop20 |
Language | English |