Dataset for Coaxial tips for a scanning microwave microscope and its calibration with dielectric references
Eckmann B., Herzog B., Lin H.J, de Preville S., Hoffmann J.P, Zeier M.scanning microwave microscopy, AFM, SMM, calibration, material properties, nanoelectrics
| Document type | Datasets |
| Journal title / Source | Coaxial tips for a scanning microwave microscope and its calibration with dielectric references |
| Volume | 35 |
| Page numbers / Article number | 1-9 |
| Language | Abkhazian |
| Persistent Identifier | https://zenodo.org/records/13734107 |