Coaxial tips for a scanning microwave microscope and its calibration with dielectric references
Eckmann B., Herzog B., Lin H.J, de Préville S., Hoffmann J., Zeier M.scanning microwave microscopy, AFM, SMM, calibration, material properties, nanoelectrics
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Volume | 35 |
| Issue | 8 |
| Page numbers / Article number | 085010 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2024-5-16 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/ad480d |
| Language | English |