Preliminary comparison of DUV scatterometry for CD and edge profile metrology on EUV masks
Endres J., Bodermann B., Dai G., Wurm M., Henn M.-A., Gross H., Scholze F., Diener A.Document type | Proceedings |
Journal title / Source | Fringe 2013 - 7th International Workshop on Advanced Optical Imaging and Metrology |
Page numbers / Article number | 695-700 |
Publication date | 2014 |
Conference name | FRINGE 2013 |
Conference date | 8 - 11 September 2013 |
Conference place | Nürtingen, Germany |
DOI | 10.1007/978-3-642-36359-7_128 |
ISBN | 978-3-642-36358-0 |
Web URL | http://link.springer.com/chapter/10.1007%2F978-3-642-36359-7_128#page-1 |