The gateway to Europe's
integrated metrology community.

Preliminary comparison of DUV scatterometry for CD and edge profile metrology on EUV masks

Endres J., Bodermann B., Dai G., Wurm M., Henn M.-A., Gross H., Scholze F., Diener A.
Document type Proceedings
Journal title / Source Fringe 2013 - 7th International Workshop on Advanced Optical Imaging and Metrology
Page numbers / Article number 695-700
Publication date 2014
Conference name FRINGE 2013
Conference date 8 - 11 September 2013
Conference place Nürtingen, Germany
DOI 10.1007/978-3-642-36359-7_128
ISBN 978-3-642-36358-0
Web URL http://link.springer.com/chapter/10.1007%2F978-3-642-36359-7_128#page-1

Back to the list view

Information

Name of Call / Funding Programme
EMRP A169: Call 2010 Industry