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Dataset for the publication "Investigating the Trackability of Silicon Microprobes in High-Speed Surface Measurements"

Keywords:

surface topography measurement, piezoresistive devices, high-speed techniques, surface roughness, silicon, cantilevers

Document type Datasets
Journal title / Source
Persistent Identifier https://oar.ptb.de/resources/show/10.7795/720.20211124

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Information

Name of Call / Funding Programme
EMPIR 2017: Industry