New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods
Fabricius Norbert (TRESCAL), Serazio Danilo, Cultrera Alessandro, Callegaro LucaGrapheneRepeatabilityElectrical propertiesStandardization
| Document type | Article |
| Journal title / Source | Measurement |
| Volume | 236 |
| Issue | 1 |
| Page numbers / Article number | 114980 |
| Publisher's name | Elsevier BV |
| Publisher's address (city only) | Amsterdam, NX, Netherlands |
| Publication date | 2024-8-15 |
| ISSN | 0263-2241 |
| DOI | 10.1016/j.measurement.2024.114980 |
| Web URL | https://doi.org/10.1016/j.measurement.2024.114980 |
| Language | English |