Photometric Characterization Of Extended Sources By Subsource Goniospectroradiometry
Ferrero A., Velázquez J.L. , Hernanz M.L., Campos J., Pons A.GONIOSPECTRORADIOMETRY, OLED, photometry, near-field, sub-source
| Document type | Proceedings |
| Journal title / Source | Proceedings of the CIE Tutorial and Expert Symposium on the CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard |
| Volume | 1 |
| Page numbers / Article number | 24-33 |
| Publisher's name | Commission Internationale de L'Eclairage |
| Publisher's address (city only) | CIE Central Bureau, Babenbergerstraße 9/9A, 1010 Vienna, Austria |
| Publication date | 2015-11-26 |
| Conference name | CIE Tutorial and Expert Symposium on the CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard |
| Conference date | 26-11-2015 to 26-11-2015 |
| Conference place | Braunschweig, Germany |
| ISBN | 978-3-902842-28-2 |
| Language | English |