First ac measurements of the quantum Hall effect in epitaxial graphene
Kalmbach C., Schurr J., Ahlers F.J., Müller A., Novikov S., Lebedeva N., Satrapinsky A.AC analysis technique,AC loss elimination,AC measurement,C,Electrical resistance measurement,Gallium arsenide,Graphene,Hall effect,Impedance,Noise,Resistance,electric current measurement,epitaxial graphene-based impedance standard,graphene,impedance,quantized Hall resistance,quantum Hall effect,spectral noise density
| Document type | Proceedings |
| Journal title / Source | 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) |
| Page numbers / Article number | 38--39 |
| Publisher's name | IEEE |
| Publication date | 2016-8 |
| ISSN | 0589-1485 |
| DOI | 10.1109/CPEM.2014.6898247 |
| ISBN | 978-1-4799-2479-0 |
| Web URL | http://ieeexplore.ieee.org/articleDetails.jsp?arnumber=6898247 |
| Language | English |