Robustness of single-electron pumps at sub-ppm current accuracy level
Stein F, Scherer H, Gerster T, Behr R, Götz M, Pesel E, Leicht C, Ubbelohde N, Weimann T, Pierz K, Schumacher H W, Hohls Fsingle-electron pumps, small-current measurement,
Document type | Article |
Journal title / Source | Metrologia |
Volume | 54 |
Issue | 1 |
Page numbers / Article number | S1-S8 |
Publisher's name | IOP Publishing |
Publisher's address (city only) | Temple Circus, Temple Way, Bristol, BS1 6BE, United Kingdom |
Publication date | 2016-12-20 |
ISSN | 0026-1394, 1681-7575 |
DOI | 10.1088/1681-7575/54/1/S1 |
Language | English |