Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films
Streeck CS, Brunken SB, Gerlach MG, Herzog CHB, Hönicke PH, Kaufmann CAK, Lubeck JL, Malzer WM, Pollakowski BP, Unterumsberger RU, Weber AW, Beckhoff BB, Kanngießer BK, Schock HWS, Mainz RMFluorescence, copper, synchrotron radiation, x-ray fluorescence spectroscopy, solar cells
| Document type | Article |
| Journal title / Source | Applied Physics Letters |
| Peer-reviewed article | 1 |
| Volume | 103 |
| Issue | 11 |
| Page numbers / Article number | 1-12 |
| Publisher's name | AIP Publishing |
| Publisher's address (city only) | New York |
| Publication date | 2013-9-12 |
| ISSN | 0003-6951 |
| DOI | 10.1063/1.4821267 |
| Web URL | http://scitation.aip.org/content/aip/journal/apl/103/11/10.1063/1.4821267 |
| Language | English |