High precision dimensional metrology of periodic nanostructures using laser scatterometry
Bodermann Bernd, Bonifer Stefanie, Buhr Egbert, Diener Alexander, Wurm MatthiasDocument type | Proceedings |
Journal title / Source | |
Publication date | 2015 |
Conference name | 10th IMEKO Symposium Laser Metrology for Precision Measurement and Inspection in Industry |
Conference date | 12 - 13 September 2011 |
Conference place | Braunschweig, Germany |
ISBN | 978-3-18-092156-3 |
Language | English |