Calibration Algorithm for Nearfield Scanning Microwave Microscopes
Hoffmann J., Wollensack M., Zeier M., Niegemann J., Huber H.-P., Kienberger F.| Document type | Proceedings |
| Journal title / Source | Proceedings of the IEEE Nano 2012 |
| Publication date | 2013 |
| Conference name | IEEE Nano 2012: 12th International Conference on Nanotechnology |
| Conference date | 20 - 23 August 2012 |
| Conference place | Birmingham, UK |