Investigation of CVD graphene topography and surface electrical properties
Wang R, Pearce R, Gallop J, Patel T, Zhao F, Pollard A, Klein N, Jackman R, Zurutuza A, Hao Lgraphene, Raman spectroscopy, Metrology, scanning probe microscopy techniques
| Document type | Article |
| Journal title / Source | Surface Topography: Metrology and Properties |
| Peer-reviewed article | 1 |
| Volume | 4 |
| Issue | 2 |
| Page numbers / Article number | 025001 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol |
| Publication date | 2016-2-29 |
| ISSN | n/a |
| DOI | 10.1088/2051-672X/4/2/025001 |
| Web URL | http://iopscience.iop.org/article/10.1088/2051-672X/4/2/025001/pdf |
| Language | English |