VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating
Kazemipour A., Hoffmann J., Wollensack M., Allal D., Hudlicka M., Ruefenacht J., Stalder D., Zeier M.Material characterization, parameter extraction, VNA time-gating, RF metrology, measurement uncertainty
| Document type | Proceedings |
| Journal title / Source | 2020 Conference on Precision Electromagnetic Measurements (CPEM) |
| Volume | N/A |
| Issue | N/A |
| Page numbers / Article number | 1-2 |
| Publisher's name | IEEE |
| Publication date | 2020-8 |
| Conference name | 2020 Conference on Precision Electromagnetic Measurements (CPEM) |
| Conference date | 24-08-2020 to 28-08-2020 |
| Conference place | Denver, CO, USA |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM49742.2020.9191818 |
| ISBN | 978-1-7281-5898-3 |
| Web URL | https://doi.org/10.5281/zenodo.4243044 |
| Language | English |