Standard Load Method: A New Calibration Technique for Material Characterization at Terahertz Frequencies
Kazemipour A., Hoffmann J., Wollensack M., Hudlicka M., Rüfenacht J., Stalder D., Allal D., Gäumann G., Zeier M.Material characterization, measurement uncertainty, parameter extraction, standard load, vector network analyzer (VNA) time gating
Document type | Article |
Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
Volume | 70 |
Issue | N/A |
Page numbers / Article number | 1007310 |
Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
Publication date | 2021-5 |
ISSN | 0018-9456, 1557-9662 |
DOI | 10.1109/TIM.2021.3077660 |
Language | English |