Material Parameter Extraction in THz Domain, Simplifications and Sensitivity Analysis
Kazemipour A., Wollensack M., Hoffmann J., Yee S-K., Rüfenacht J., Gäumann G., Hudlicka M., Zeier M.material characterization, extraction method, THz domain, sensitivity coefficient, measurement uncertainty
| Document type | Proceedings |
| Journal title / Source | 2019 IEEE Asia-Pacific Microwave Conference (APMC) |
| Volume | N/A |
| Issue | N/A |
| Page numbers / Article number | 276-278 |
| Publisher's name | IEEE |
| Publication date | 2019-12 |
| Conference name | 019 IEEE Asia-Pacific Microwave Conference (APMC) |
| Conference date | 10-12-2019 to 13-12-2019 |
| Conference place | Singapore |
| ISSN | N/A |
| DOI | 10.1109/APMC46564.2019.9038523 |
| ISBN | 978-1-7281-3517-5 |
| Web URL | https://doi.org/10.5281/zenodo.4243025 |
| Language | English |