Flat thin films forward simulations (Complex fresnel rs and rp). Rough thin film of sio2, sweeped in thickness about 1micron (Intensity and raw rs and rp.) Both as measured with 0 to NA = 0.9 angles.
Kolenov D, Pereira Sthin films, forward simulations
| Document type | Datasets |
| Journal title / Source | |
| Publication date | 2024-3 |
| DOI | 10.5281/zenodo.10800080 |
| Language | Abkhazian |