The gateway to Europe's
integrated metrology community.

Impact ionization in silicon at low charge-carrier energies

Korpusenko M., Vaskuri A., Manoocheri F., Ikonen E.
Keywords:

PQED, ultraviolet, photodiode responsivity, induced junction

Document type Article
Journal title / Source AIP Advances
Volume 13
Issue 8
Page numbers / Article number 1-4
Publisher's name AIP Publishing
Publisher's address (city only) Melville, NY, United States
Publication date 2023-8
ISSN 2158-3226
DOI 10.1063/5.0164405
Web URL https://pubs.aip.org/aip/adv/article/13/8/085119/2907501
Language English

Back to the list view

Information

Name of Call / Funding Programme
Metrology Partnership 2022: Integrated European Metrology