Impact ionization in silicon at low charge-carrier energies
Korpusenko M., Vaskuri A., Manoocheri F., Ikonen E.PQED, ultraviolet, photodiode responsivity, induced junction
Document type | Article |
Journal title / Source | AIP Advances |
Volume | 13 |
Issue | 8 |
Page numbers / Article number | 1-4 |
Publisher's name | AIP Publishing |
Publisher's address (city only) | Melville, NY, United States |
Publication date | 2023-8 |
ISSN | 2158-3226 |
DOI | 10.1063/5.0164405 |
Web URL | https://pubs.aip.org/aip/adv/article/13/8/085119/2907501 |
Language | English |