Irradiated Silicon for Microwave and Millimeter Wave Applications
Krupka J., Salski B., Karpisz T., Kopyt P., Jensen L., Wojciechowski M.Microwave measurement, millimeter wave measurement, permittivity, silicon
| Document type | Article |
| Journal title / Source | IEEE Microwave and Wireless Components Letters |
| Volume | 32 |
| Issue | 6 |
| Page numbers / Article number | 700-703 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication date | 2022-6 |
| ISSN | 1531-1309, 1558-1764 |
| DOI | 10.1109/LMWC.2022.3161393 |
| Language | English |