Metrological characterization methods for confocal chromatic line sensors and optical topography sensors
Seppä J., Niemelä K., Lassila A.optical sensors, calibration, metrology, optical scanners
Document type | Article |
Journal title / Source | Measurement Science and Technology |
Volume | 29 |
Issue | 054008 |
Page numbers / Article number | 054008 |
Publisher's name | IOP Publishing |
Publisher's address (city only) | Bristol? |
Publication date | 2018-4 |
ISSN | 0957-0233 |
DOI | 10.1088/1361-6501/aaad2b |
Language | English |