Novel devices and methods for quantum resistance and impedance metrology
Marzano M.resistance metrology, impedance metrology, quantum Hall effect, impedance bridge, fully-digital impedance bridge
Document type | Thesis |
Journal title / Source | |
University name | Politecnico di Torino, Torino, Italy |
Publication date | 2020-1-13 |
Language | English |
Persistent Identifier | http://hdl.handle.net/11583/2779393 |