The lattice parameter of the 28Si spheres in the determination of the Avogadro constant
Massa E., Mana G., Ferroglio L., Kessler E. G., Schiel D., Zakel S.Avogadro constant, X-ray interferometry, Laue diffractometry, lattice strain
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 48 |
| Issue | 2 |
| Publication date | 2011-3-22 |
| DOI | 10.1088/0026-1394/48/2/S07 |