Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
Morán-Meza J., Richert D., Gramse G., Haddadi K., Herzog B., Théron D., Lin H.J, Eckmann B., de Préville S., Hoffmann J., Piquemal F.Gain measurement, impedance, impedance matching, noise measurement, scanning microwave microscopy (SMM)
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 73 |
| Issue | 1 |
| Page numbers / Article number | 1-9 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2024-5 |
| ISSN | 0018-9456, 1557-9662 |
| Web URL | https://arxiv.org/pdf/2409.11207 |
| Language | English |
| Persistent Identifier | https://arxiv.org/pdf/2409.11207 |