Automated Contacting of On-Wafer Devices for RF Testing
Mubarak F., Martino C.D., Toskovic R., Rietveld G., Spirito M.On-wafer probing, on-wafer contacting, microwave measurements, measurement techniques, measurement uncertainty, precision measurements, uncertainty
| Document type | Proceedings |
| Journal title / Source | 2020 Conference on Precision Electromagnetic Measurements (CPEM) |
| Volume | N/A |
| Issue | N/A |
| Page numbers / Article number | 1-2 |
| Publisher's name | IEEE |
| Publication date | 2020-9-10 |
| Conference name | 2020 Conference on Precision Electromagnetic Measurements (CPEM) |
| Conference date | 24-08-2020 to 28-08-2020 |
| Conference place | Denver (Aurora), CO, USA, USA |
| ISSN | 2160-0171 |
| ISBN | 978-1-7281-5899-0 |
| Web URL | https://zenodo.org/record/4276095 |
| Language | English |
| Persistent Identifier | https://doi.org/10.1109/CPEM49742.2020.9191800 |