Noncontact Atomic Force Microscopy Volume 3 Chapter 3: Simultaneous nc-AFM/STM Measurements with Atomic Resolution
Hapala P., Ondrácek M., Stetsovych O., Švec M., Jelínek P.AFM/STM measurements
| Document type | Contribution to book |
| Journal title / Source | |
| Book title | Noncontact Atomic Force Microscopy |
| Volume | 3 |
| Page numbers / Article number | 29-24 |
| Publisher's name | Springer International Publishing Switzerland |
| Publication date | 2015 |
| DOI | 10.1007/978-3-319-15588-3_3 |
| ISBN | 978-3-319-15587-6 |
| Language | English |