Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
Phung G.N., Arz U.conductor-backed coplanar waveguides, calibration, parallel-plate-line or microstrip mode, probes, radiation
Document type | Proceedings |
Journal title / Source | 2021 Kleinheubach Conference |
Publisher's name | IEEE |
Publication date | 2021-11 |
Conference name | 2021 Kleinheubach Conference |
Conference date | 28-09-2021 to 30-09-2021 |
Conference place | Miltenberg |
ISBN | 978-3-948571-04-7 |
Web URL | https://oar.ptb.de/resources/show/10.7795/EMPIR.18SIB09.CA.20220915B https://oar.ptb.de/files/download/632b0867704400007c006388 |
Language | English |
Persistent Identifier | 978-3-948571-04-7 |