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Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides

Phung G.N., Arz U.
Keywords:

conductor-backed coplanar waveguides, calibration, parallel-plate-line or microstrip mode, probes, radiation

Document type Proceedings
Journal title / Source 2021 Kleinheubach Conference
Publisher's name IEEE
Publication date 2021-11
Conference name 2021 Kleinheubach Conference
Conference date 28-09-2021 to 30-09-2021
Conference place Miltenberg
ISBN 978-3-948571-04-7
Web URL https://oar.ptb.de/resources/show/10.7795/EMPIR.18SIB09.CA.20220915B
https://oar.ptb.de/files/download/632b0867704400007c006388
Language English
Persistent Identifier 978-3-948571-04-7

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