Impact of Chuck Boundary Conditions on Wideband On-Wafer Measurements
Phung G.N., Arz U.coplanar waveguides, leakage, radiation, surface waves
Document type | Proceedings |
Journal title / Source | 2021 IEEE 25th Workshop on Signal and Power Integrity (SPI) |
Page numbers / Article number | 1-4 |
Publisher's name | IEEE |
Publication date | 2021-5-10 |
Conference name | 2021 IEEE 25th Workshop on Signal and Power Integrity (SPI) |
Conference date | 10-05-2021 to 12-05-2021 |
Conference place | Siegen, Germany |
DOI | 10.1109/SPI52361.2021.9505192 |
Web URL | https://oar.ptb.de/files/download/618907218e2a000011003f97 |
Language | English |