PTB's enhanced stitching approach for the high-accuracy interferometric form error characterization of spheres
Bartl Guido, Krystek Michael, Nicolaus Arnoldsub-aperture stitching, form error, silicon sphere, roundness, sphere interferometer
| Document type | Article |
| Journal title / Source | Meas. Sci. Technol. |
| Peer-reviewed article | 1 |
| Volume | 25 |
| Issue | - |
| Page numbers / Article number | 064002 (8pp) |
| Publisher's name | IOP |
| Publisher's address (city only) | UK |
| Publication date | 2014 |
| ISSN | - |
| DOI | 10.1088/0957-0233/25/6/064002 |
| Web URL | - |
| Language | English |